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Co-authors
- Nigel D BrowningProfessor of Materials Science, University of LiverpoolVerified email at liverpool.ac.uk
- Alex RobinsonSenseAI Innovations Ltd., University of LiverpoolVerified email at liverpool.ac.uk
- Angus KirklandOxford UniversityVerified email at materials.ox.ac.uk
- Daniel NichollsUniversity of LiverpoolVerified email at liverpool.ac.uk
- Laurent JacquesProfessor, ISPGroup, INMA/ICTEAM, UCLouvain, BelgiumVerified email at uclouvain.be
- Valerio CambareriPrincipal Software Engineer, Sony Depthsensing Solutions NVVerified email at sony.com
- Kévin DegrauxSystem Engineer (R&D), Sony Depthsensing Solutions SAVerified email at sony.com
- Christophe De VleeschouwerProfessor, ICTEAM, EPL, Université catholique de LouvainVerified email at uclouvain.be
- José M. Bioucas DiasInstituto de Telecomunicaçőes, Instituto Superior Técnico, Universidade de Lisboa, PortugalVerified email at lx.it.pt
- Roland FleckProfessorVerified email at kcl.ac.uk
- Zoë BroadUniversity of LiverpoolVerified email at liverpool.ac.uk
- Miaofang ChiCenter for Nanophase Materials Sciences, Oak Ridge National LabVerified email at ornl.gov
- Adriana GonzálezImage Processing Engineer. PhD Graduate in Engineering SciencesVerified email at uclouvain.be
- Seyed Abolfazl GhasemzadehPhD Candidate, UCLouvainVerified email at uclouvain.be
- Gabriel van ZandyckeUCLouvainVerified email at uclouvain.be
- Mohammad Ali akhaeeAssociate Professor of Electrical& Computer Eng., University of TehranVerified email at ut.ac.ir
- Ian MacLarenUniversity of Glasgow, School of Physics and AstronomyVerified email at glasgow.ac.uk
- Mounib BahriUniversity of LiverpoolVerified email at liverpool.ac.uk
- Maxime IstasseUCLouvain / ICTEAMVerified email at uclouvain.be
- Damien McGroutherApplications Specialist - EO, JEOL UK LtdVerified email at jeoluk.com