| Bipolar transistor R Minixhofer, G Roehrer US Patent 7,319,251, 2008 | 178 | 2008 |
| Interface traps density-of-states as a vital component for hot-carrier degradation modeling SE Tyaginov, IA Starkov, O Triebl, J Cervenka, C Jungemann, S Carniello, ... Microelectronics Reliability 50 (9-11), 1267-1272, 2010 | 77 | 2010 |
| Modeling of hot-carrier degradation in nLDMOS devices: Different approaches to the solution of the Boltzmann transport equation P Sharma, S Tyaginov, Y Wimmer, F Rudolf, K Rupp, M Bina, ... IEEE Transactions on Electron Devices 62 (6), 1811-1818, 2015 | 41 | 2015 |
| A 120V 180nm High Voltage CMOS smart power technology for system-on-chip integration R Minixhofer, N Feilchenfeld, M Knaipp, G Röhrer, JM Park, M Zierak, ... 2010 22nd International Symposium on Power Semiconductor Devices & IC's …, 2010 | 33 | 2010 |
| TCAD modeling of negative bias temperature instability T Grasser, R Entner, O Triebl, H Enichlmair, R Minixhofer 2006 International Conference on Simulation of Semiconductor Processes and …, 2006 | 29 | 2006 |
| Investigations on the high current behavior of lateral diffused high-voltage transistors M Knaipp, G Rohrer, R Minixhofer, E Seebacher IEEE transactions on electron devices 51 (10), 1711-1720, 2004 | 28 | 2004 |
| Hot-carrier degradation modeling using full-band Monte-Carlo simulations SE Tyaginov, IA Starkov, O Triebl, J Cervenka, C Jungemann, S Carniello, ... 2010 17th IEEE International Symposium on the Physical and Failure Analysis …, 2010 | 27 | 2010 |
| Vertical Hall sensor and method of producing a vertical Hall sensor R Minixhofer, S Carniello, V Peters US Patent 8,426,936, 2013 | 23 | 2013 |
| Process variation aware ESD design window considerations on a 0.18 μm analog, mixed-signal high voltage technology F Roger, W Reinprecht, R Minixhofer EOS/ESD Symposium Proceedings, 1-7, 2011 | 19 | 2011 |
| Radiation-detecting optoelectronic component R Minixhofer US Patent 7,683,449, 2010 | 19 | 2010 |
| Hot carrier stress degradation modes in p-type high voltage LDMOS transistors H Enichlmair, JM Park, S Carniello, B Loeffler, R Minixhofer, M Levy 2009 IEEE International Reliability Physics Symposium, 426-431, 2009 | 17 | 2009 |
| Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures S Holzer, R Minixhofer, C Heitzinger, J Fellner, T Grasser, S Selberherr Microelectronics Journal 35 (10), 805-810, 2004 | 17 | 2004 |
| TCAD as an integral part of the semiconductor manufacturing environment R Minixhofer 2006 International Conference on Simulation of Semiconductor Processes and …, 2006 | 16 | 2006 |
| Building interchangeable black-box models of integrated circuits for EMC simulations M Magerl, C Stockreiter, O Eisenberger, R Minixhofer, A Baric 2015 10th International Workshop on the Electromagnetic Compatibility of …, 2015 | 14 | 2015 |
| FlexRay transceiver in a 0.35 µm CMOS high-voltage technology F Baronti, P D'Abramo, M Knaipp, R Minixhofer, R Roncella, R Saletti, ... Proceedings of the Design Automation & Test in Europe Conference 2, 1-5, 2006 | 14 | 2006 |
| Planar dual gate oxide LDMOS structures in 180nm power management technology S Sharma, T Letavic, Y Shi, A Loiseau, JE Monaghan, N Feilchenfeld, ... 2012 24th International Symposium on Power Semiconductor Devices and ICs …, 2012 | 13 | 2012 |
| Scalable high voltage CMOS technology for smart power and sensor applications M Schrems, M Knaipp, H Enichlmair, V Vescoli, R Minixhofer, ... e & i Elektrotechnik und Informationstechnik 4 (125), 109-117, 2008 | 13 | 2008 |
| Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures R Entner, T Grasser, O Triebl, H Enichlmair, R Minixhofer Microelectronics Reliability 47 (4-5), 697-699, 2007 | 13 | 2007 |
| Three-dimensional transient electro-thermal simulation C Harlander, R Sabelka, R Minixhofer, S Selberherr 5th THERMINIC Workshop, 169-172, 1999 | 13 | 1999 |
| TCAD electrical parameters extraction on through silicon via (TSV) structures in a 0.35 μm analog mixed-signal CMOS F Roger, J Kraft, K Molnar, R Minixhofer Proceedings of the 2012 International Conference on Simulation of …, 2012 | 12 | 2012 |
