Sambit Palit

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Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue UniversityVerified email at purdue.edu
Dhanoop VargheseTexas InstrumentsVerified email at ti.com
Alejandro StrachanReilly Professor of Materials Engineering, Purdue UniversityVerified email at purdue.edu
Ravi Pramod VedulaPurdue UniversityVerified email at purdue.edu
Xin XuPurdue UniversityVerified email at purdue.edu
Arvind RamanPurdue UniversityVerified email at purdue.edu
Udayan GangulyProfessor, Electrical Engineering, IIT BombayVerified email at ee.iitb.ac.in
Aneesh NainaniStanford Univeristy, Applied MaterialsVerified email at stanford.edu
Souvik MahapatraProfessor, EE Dept, IIT Bombay (Fellow of IEEE, INSA, IASc, INAE)Verified email at ee.iitb.ac.in
Ankit JainStaff Device Engineer, Intel, Hillsboro, Oregon
Pawan Kishore SinghCypress SemiconductorVerified email at cypress.com
SangHoon ShinPurdue UniversityVerified email at purdue.edu
Muhammad MasuduzzamanPurdue UniversityVerified email at purdue.edu

Sambit Palit

Intel Corporation

Verified email at intel.com - Homepage

Defects and Reliability Dielectrics Flash Memories MEMS Polymers


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A Physics-Based Predictive Modeling Framework for Dielectric Charging and Creep in RF MEMS Capacitive Switches and Varactors A Jain, S Palit, MA Alam Microelectromechanical Systems, Journal of, 1-11, 2012	68	2012
Theory of charging and charge transport in “intermediate” thickness dielectrics and its implications for characterization and reliability S Palit, MA Alam Journal of Applied Physics 111 (5), 2012	35	2012
The role of dielectric heating and effects of ambient humidity in the electrical breakdown of polymer dielectrics S Palit, D Varghese, H Guo, S Krishnan, MA Alam IEEE Transactions on Device and Materials Reliability 15 (3), 308-318, 2015	20	2015
Role of atomic variability in dielectric charging: A first-principles-based multiscale modeling study RP Vedula, S Palit, MA Alam, A Strachan Physical Review B 88 (20), 205204, 2013	16	2013
Implications of rough dielectric surfaces on charging-adjusted actuation of RF-MEMS S Palit, X Xu, A Raman, MA Alam IEEE Electron Device Letters 35 (9), 948-950, 2014	13	2014
Development of a 3D simulator for metal nanocrystal (NC) flash memories under NAND operation A Nainani, S Palit, PK Singh, U Ganguly, N Krishna, J Vasi, S Mahapatra 2007 IEEE International Electron Devices Meeting, 947-950, 2007	12	2007
Universal scaling and intrinsic classification of electro-mechanical actuators S Palit, A Jain, M Ashraful Alam Journal of Applied Physics 113 (14), 2013	10	2013
Electrical breakdown in polymers for BEOL applications: Dielectric heating and humidity effects S Palit, MA Alam 2014 IEEE International Reliability Physics Symposium, BD. 1.1-BD. 1.4, 2014	8	2014
A non-obtrusive technique to characterize dielectric charging in RF-MEMS capacitive switches S Palit, MA Jain, Ankit, Alam Reliability Physics Symposium (IRPS), 2012 IEEE International, 3F.3.1-3F.3.6, 2012	1	2012
Charging and breakdown in amorphous dielectrics: Phenomenological modeling approach and applications S Palit Purdue University, 2014		2014
MEMS Lab Simulation Tool OD Adeosun, S Palit, A Jain, MA Alam		2013

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