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Bo Pu
Bo Pu
IEEE Senior Member, Missouri Univ. of Science and Technology
Verified email at mst.edu
Title
Cited by
Cited by
Year
Semiconductor Package and Method of Manufacturing the Same
B Pu, J Pak, JY Park, S Nam
US Patent 20,210,028,100, 2019
66*2019
Modeling and parameter extraction of coplanar symmetrical meander lines
B Pu, KH Kim, SY Kim, W Nah
IEEE Transactions on Electromagnetic Compatibility 57 (3), 375-383, 2015
222015
Electromagnetic susceptibility analysis of ICs using DPI method with consideration of PDN
B Pu, JJ Lee, SK Kwak, SY Kim, W Nah
2012 Asia-Pacific Symposium on Electromagnetic Compatibility, 77-80, 2012
172012
Efficient DC and AC impedance calculation for arbitrary-shape and multilayer PDN using boundary integration
L Zhang, J Juang, Z Kiguradze, B Pu, S Jin, S Wu, Z Yang, EP Li, J Fan, ...
IEEE Transactions on Signal and Power Integrity 1, 1-11, 2022
132022
Fast impedance prediction for power distribution network using deep learning
L Zhang, J Juang, Z Kiguradze, B Pu, S Jin, S Wu, Z Yang, J Fan, ...
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2022
112022
A modified genetic algorithm for the selection of decoupling capacitors in pdn design
J Juang, L Zhang, Z Kiguradze, B Pu, S Jin, C Hwang
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 712-717, 2021
102021
Immunity enhancement of the power distribution network in integrated circuits with coplanar meander lines in package
B Pu, J Fan, W Nah
IEEE Transactions on Electromagnetic Compatibility 62 (5), 2238-2246, 2020
92020
The simulated TDR impedance in PCB material characterization
Y Guo, DH Kim, J He, S Yong, Y Liu, B Pu, X Ye, J Fan
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 831-834, 2021
82021
Far-end crosstalk control strategy for high-volume high-speed PCB manufacturing: The concept of critical resin content percent
Y Guo, S Yong, Y Liu, J He, B Pu, X Ye, A Sutono, V Kunda, A Luoh, ...
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 820-824, 2021
82021
Training set optimization in an artificial neural network constructed for high bandwidth interconnects design
B Pu, H Kim, XD Cai, B Sen, C Sui, J Fan
IEEE Transactions on Microwave Theory and Techniques 70 (6), 2955-2964, 2022
72022
Signal Integrity Design Methodology for Package in Co-packaged Optics Based on Figure of Merit as Channel Operating Margin
B Pu, J He, A Harmon, Y Guo, Y Liu, Q Cai
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 492-497, 2021
72021
Prepreg and Core Dielectric Permittivity (ϵr) Extraction for Fabricated Striplines’ Far-End Crosstalk Modeling
S Yong, S Penugonda, DH Kim, V Khilkevich, B Pu, X Ye, Q Gao, XD Cai, ...
IEEE Transactions on Electromagnetic Compatibility 64 (1), 209-218, 2021
72021
A de-embedding technique of a three-port network with two ports coupled
B Pu, J Kim, W Nah
Journal of electromagnetic engineering and science 15 (4), 258-265, 2015
72015
Estimation of transferred power from a noise source to an IC with forwarded power characteristics
B Pu, T Kim, SJ Kim, JH Kim, SY Kim, W Nah
Journal of electromagnetic engineering and science 13 (4), 233-239, 2013
72013
Design of 2.5 D interposer in high bandwidth memory and through silicon via for high speed signal
B Pu, JS Pak, C Jo, S Moon
UBM DesignCon Conference, 2019
6*2019
A Novel Machine-Learning-Based Batch Selection Method in Sparse Near-Field Scanning
L Zhang, YR Feng, B Pu, XD Cai, D Li, XC Wei, B Mutnury, J Fan, H Chen, ...
IEEE Transactions on Microwave Theory and Techniques 70 (11), 5019-5028, 2022
52022
Prediction of impedance characteristics of MLCC using multiconductor transmission line theory
J Jeon, H Lee, B Pu, JH Kim, N Zhang, W Nah
IEEE Transactions on Electromagnetic Compatibility 58 (6), 1760-1771, 2016
52016
Analysis of filtering characteristics for coplanar symmetrical meander lines
B Pu, K Kim, J Yousaf, W Nah
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2016
52016
Package design methodology in consideration with signal integrity, power integrity and electromagnetic immunity
B Pu, K Kim, W Nah
2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS), 1-4, 2014
52014
Modeling and prediction of electromagnetic immunity for integrated circuits
B Pu, T Kim, SJ Kim, SY Kim, W Nah
Journal of electromagnetic engineering and science 13 (1), 54-61, 2013
52013
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Articles 1–20