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Frans Widdershoven
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Modeling statistical dopant fluctuations in MOS transistors
PA Stolk, FP Widdershoven, DBM Klaassen
IEEE Transactions on Electron devices 45 (9), 1960-1971, 1998
5361998
Real-time imaging of microparticles and living cells with CMOS nanocapacitor arrays
C Laborde, F Pittino, HA Verhoeven, SG Lemay, L Selmi, MA Jongsma, ...
Nature nanotechnology 10 (9), 791-795, 2015
1182015
Closed-and open-boundary models for gate-current calculation in n-MOSFETs
A Dalla Serra, A Abramo, P Palestri, L Selmi, F Widdershoven
IEEE Transactions on Electron Devices 48 (8), 1811-1815, 2001
702001
Examination of the Si (111) SiO2, Si (110) SiO2, and Si (100) SiO2 interfacial properties following rapid thermal annealing
PK Hurley, BJ O’Sullivan, FN Cubaynes, PA Stolk, FP Widdershoven, ...
Journal of the Electrochemical Society 149 (3), G194, 2002
442002
Amiware: Hardware technology drivers of ambient intelligence
S Mukherjee, E Aarts, R Roovers, F Widdershoven, M Ouwerkerk
Springer Science & Business Media, 2006
432006
CMOS biosensor platform
F Widdershoven, D Van Steenwinckel, J Überfeld, T Merelle, H Suy, ...
2010 International Electron Devices Meeting, 36.1. 1-36.1. 4, 2010
362010
A CMOS pixelated nanocapacitor biosensor platform for high-frequency impedance spectroscopy and imaging
F Widdershoven, A Cossettini, C Laborde, A Bandiziol, PP van Swinderen, ...
IEEE transactions on biomedical circuits and systems 12 (6), 1369-1382, 2018
352018
Device modeling of statistical dopant fluctuations in MOS transistors
PA Stolk, FP Widdershoven, DBM Klaassen
SISPAD'97. 1997 International Conference on Simulation of Semiconductor …, 1997
311997
High-frequency nanocapacitor arrays: concept, recent developments, and outlook
SG Lemay, C Laborde, C Renault, A Cossettini, L Selmi, ...
Accounts of chemical research 49 (10), 2355-2362, 2016
242016
Numerical and analytical models to investigate the AC high-frequency response of nanoelectrode/SAM/electrolyte capacitive sensing elements
F Pittino, L Selmi, F Widdershoven
Solid-state electronics 88, 82-88, 2013
202013
Explanation of SILC probability density distributions with nonuniform generation of traps in the tunnel oxide of flash memory arrays
E Vianello, F Driussi, D Esseni, L Selmi, F Widdershoven, MJ van Duuren
IEEE transactions on electron devices 54 (8), 1953-1962, 2007
202007
On ambient intelligence, needful things and process technologies
C van der Poel, F Pessolano, R Roovers, F Widdershoven, ...
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat …, 2004
182004
Numerical simulation of the position and orientation effects on the impedance response of nanoelectrode array biosensors to DNA and PNA strands
F Pittino, F Passerini, L Selmi, F Widdershoven
Microelectronics Journal 45 (12), 1695-1700, 2014
162014
Investigation of the energy distribution of stress-induced oxide traps by numerical analysis of the TAT of HEs
F Driussi, R Iob, D Esseni, L Selmi, R van Schaijk, F Widdershoven
IEEE transactions on electron devices 51 (10), 1570-1576, 2004
152004
Flat band voltage shift and oxide properties after rapid thermal annealing
BJ O'Sullivan, PK Hurley, FN Cubaynes, PA Stolk, FP Widdershoven
Microelectronics Reliability 41 (7), 1053-1056, 2001
152001
A comparative analysis of substrate current generation mechanisms in tunneling MOS capacitors
P Palestri, AD Serra, L Selmi, M Pavesi, PL Rigolli, A Abramo, ...
IEEE Transactions on Electron Devices 49 (8), 1427-1435, 2002
142002
Cathode hot electrons and anode hot holes in tunneling MOS capacitors
P Palestri, L Selmi, E Sangiorgi, M Pavesi, F Widdershoven
30th European Solid-State Device Research Conference, 296-299, 2000
142000
Experimental characterization of statistically independent defects in gate dielectrics-Part I: Description and Validation of the Model
F Driussi, F Widdershoven, D Esseni, L Selmi, MJ van Duuren
IEEE transactions on electron devices 52 (5), 942-948, 2005
132005
Derivation and numerical verification of a compact analytical model for the AC admittance response of nanoelectrodes, suitable for the analysis and optimization of impedance …
F Pittino, P Scarbolo, F Widdershoven, L Selmi
IEEE Transactions on Nanotechnology 14 (4), 709-716, 2015
122015
Impact of ion implantation statistics on V/sub T/fluctuations in MOSFETs: comparison between decaborane and boron channel implants
H Tuinhout, F Widdershoven, P Stolk, J Schmitz, B Dirks, K van der Tak, ...
2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No …, 2000
112000
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