| Electrostatic mechanisms responsible for device degradation in proton irradiated AlGaN/AlN/GaN HEMTs A Kalavagunta, A Touboul, L Shen, RD Schrimpf, RA Reed, ... IEEE Transactions on Nuclear Science 55 (4), 2106-2112, 2008 | 82 | 2008 |
| Impact of proton irradiation-induced bulk defects on gate-lag in GaN HEMTs A Kalavagunta, M Silvestri, MJ Beck, SK Dixit, RD Schrimpf, RA Reed, ... IEEE Transactions on Nuclear Science 56 (6), 3192-3195, 2009 | 39 | 2009 |
| Effects of 2 MeV proton irradiation on operating wavelength and leakage current of vertical cavity surface emitting lasers A Kalavagunta, B Choi, MA Neifeld, R Schrimpf IEEE Transactions on Nuclear Science 50 (6), 1982-1990, 2003 | 19 | 2003 |
| Accurate geometry factor estimation for the four point probe method using comsol multiphysics A Kalavagunta, RA Weller Proceedings of the Comsol Users Conference, Boston, 2005 | 16 | 2005 |
| Design considerations for optical systems in ionizing and nonionizing radiation environments A Kalavagunta, R Schrimpf, M Neifeld IEEE transactions on nuclear science 51 (6), 3595-3602, 2004 | 14 | 2004 |
| Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs A Kalavagunta, RD Schrimpf, S Mukherjee, RA Reed Microelectronics Reliability, 2013 | 13 | 2013 |
| Understanding the impact of bulk traps on GaN HEMT DC and RF characteristics A Kalavagunta | 12 | 2009 |
| Impact of proton irradiation on a grating demultiplexer A Kalavagunta, M Neifeld, H Barnby, R Schrimpf IEEE Trans. Nucl. Sci 51, 3595-3602, 2004 | 5 | 2004 |
| Modeling nanoscale device physics in COMSOL Multiphysics A Kalavagunta COMSOL user conference, 2008 | 1* | 2008 |
| Electrostatic mechanisms responsible for device degradation in AlGaN/AlN/GaN HEMTs A Kalavagunta, A Touboul, L Shen, RD Schrimpf, RA Reed, ... 2007 9th European Conference on Radiation and Its Effects on Components and …, 2007 | 1 | 2007 |
| Modeling Mechanical Stress in the Silicon Fabrication Process using Comsol-Multiphysics A Kalavagunta | | 2007 |
| Modeling Mechanical Stress and Temperature Effects in Submicron MOSFETs A Kalavagunta COMSOL user conference, 2007 | | 2007 |
| FEM Study of Nano-Structured Surface Relief Data Storage A Kalavagunta, MA Neifeld COMSOL user conference, 2005 | | 2005 |
| Accurate estimation of geometry factor in the four point probe method using COMSOL. A Kalavagunta, RA Weller COMSOL user conference, 2005 | | 2005 |
| Imaging of Targets Using Voltage Changes Across a Self-Coupled Single-Mode Vertical Cavity Laser A Kalavagunta, M Neifeld Frontiers in Optics, TuE3, 2003 | | 2003 |
| PHOTONIC DEVICES AND INTEGRATED CIRCUITS-Effects of 2 MeV Proton Irradiation on Operating Wavelength and Leakage Current of Vertical Cavity Surface Emitting Lasers A Kalavagunta, B Choi, MA Neifeld, R Schrimpf IEEE Transactions on Nuclear Science 50 (6), 1982-1990, 2003 | | 2003 |
| FEM Study of Nano-Structured Surface-Relief Optical Data Storage A Kalavagunta, MA Neifeld | | |
Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
