SLOWNESS SURFACE CALCULATION FOR DIFFERENT MEDIA USING THE SYMBOLIC MATHEMATICS LANGUAGE MAPLE. M Duarte, C Piedrahita, T Salinas, H Altamar, K Pachano Earth sciences research journal 8 (1), 2004 | 12 | 2004 |
Calculation of phase and group angles, slowness surfaces and ray tracing in transversely isotropic media K Pachano, M Duarte, H Altamar, C Piedrahita, T Salinas, Z Calderón CT&F-Ciencia, Tecnología y Futuro 3 (2), 41-56, 2006 | 6 | 2006 |
Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy H Altamar-Mercado, A Patiño-Vanegas, AG Marrugo Applied optics 58 (5), A101-A111, 2019 | 5 | 2019 |
Toward an automatic 3D measurement of skin wheals from skin prick tests AG Marrugo, LA Romero, J Pineda, R Vargas, H Altamar-Mercado, ... Dimensional Optical Metrology and Inspection for Practical Applications VIII …, 2019 | 3 | 2019 |
Speckle free optical watermarking based on pseudo-random phase encoding A Patiño, H Altamar, JC Martínez-Santos 2016 XXI Symposium on Signal Processing, Images and Artificial Vision …, 2016 | 3 | 2016 |
Adaptive Filtering of Interference Fringes by Polar Transformation and Empirical Mode Decomposition H Altamar-Mercado, A Patiño-Vanegas, AG Marrugo Latin America Optics and Photonics Conference, W4C. 4, 2018 | 1 | 2018 |
Analysis of variations of the thickness-phase objects by lateral shearing interferometry and white light scanning interferometry HR Altamar, A Plata 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics …, 2004 | 1 | 2004 |
Slowness surface calculation for different media using the symbolic mathematics language Maple® C Piedrahita, T Salinas, H Altamar, K Pachano Earth Sciences Research Journal 8 (1), 63-67, 2004 | 1 | 2004 |
Fractional Fourier transform method of chirped fringe pattern analysis for profilometry A Patiño-Vanegas, H Altamar-Mercado, R Torres 3D Image Acquisition and Display: Technology, Perception and Applications …, 2020 | | 2020 |
Toward the generation of reproducible synthetic surface data in optical metrology J Pineda, H Altamar-Mercado, LA Romero, AG Marrugo Dimensional Optical Metrology and Inspection for Practical Applications IX …, 2020 | | 2020 |
Extended Focused Image in White Light Scanning Interference Microscopy H Altamar-Mercado, A Patiño-Vanegas, AG Marrugo Imaging Systems and Applications, ITh1C. 3, 2019 | | 2019 |
White light interferometry for estimating the surface geometry of intraocular lenses H Altamar Mercado, F Vega Lerín, A Patiño Vanegas, ... Red Iberoamericana de Óptica (RIAO), 2019 | | 2019 |
Microscopic shape from focus using white light interferometric fringes H Altamar-Mercado, A Patiño-Vanegas, AG Marrugo Digital Holography and Three-Dimensional Imaging, JTu4A. 19, 2018 | | 2018 |
MEDIDA DE VELOCIDADES DE ONDAS EN UN SÓLIDO ELÁSTICO CON ANISO-TROPÍA ORTORRÓMBICA H Altamar, Y Torres, C Piedrahita, K Pachano, MJ Duarte, T Salinas Revista Colombiana de Física 38 (2), 766, 2006 | | 2006 |