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Jeroen Boydens
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Random additive signature monitoring for control flow error detection
J Vankeirsbilck, N Penneman, H Hallez, J Boydens
IEEE transactions on Reliability 66 (4), 1178-1192, 2017
392017
Techniques and measures to achieve EMI resilience in mission-or safety-critical systems
D Pissoort, J Lannoo, J Van Waes, A Degraeve, J Boydens
IEEE Electromagnetic Compatibility Magazine 6 (4), 107-114, 2017
302017
Effectiveness of hamming single error correction codes under harsh electromagnetic disturbances
J Van Waes, J Lannoo, J Vankeirsbilck, A Degraeve, J Peuteman, ...
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE …, 2018
212018
Effectiveness of time diversity to obtain EMI-diverse redundant systems
J Lannoo, J Van Waes, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE …, 2018
202018
Effectiveness of inversion diversity to cope with EMI within a two-channel redundant system
J Lannoo, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
202018
Effectiveness of cyclic redundancy checks under harsh electromagnetic disturbances
J Van Waes, J Lannoo, A Degraeve, D Vanoost, D Pissoort, J Boydens
2017 International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2017
202017
Study on the use of different transmission line termination strategies to obtain EMI-diverse redundant systems
J Lannoo, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
192018
Test-driven development as a reliable embedded software engineering practice
P Cordemans, S Van Landschoot, J Boydens, E Steegmans
Embedded and Real Time System Development: A Software Engineering …, 2013
172013
Black & white testing: Bridging black box testing and white box testing
E Steegmans, P Bekaert, F Devos, G Delanote, N Smeets, M van Dooren, ...
Software Testing: Beheers Optimaal de Risico's van IT in uw Business, 1-12, 2004
162004
Comparative study on data error detection techniques in embedded systems
VB Thati, J Vankeirsbilck, J Boydens
2016 XXV International Scientific Conference Electronics (ET), 1-4, 2016
152016
Random additive control flow error detection
J Vankeirsbilck, N Penneman, H Hallez, J Boydens
Computer Safety, Reliability, and Security: 37th International Conference …, 2018
142018
Resilience of error correction codes against harsh electromagnetic disturbances: Fault mechanisms
J Van Waes, D Vanoost, J Vankeirsbilck, J Lannoo, D Pissoort, J Boydens
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1017-1027, 2019
132019
Test-driven development of embedded software
J Boydens, P Cordemans, E Steegmans
Proceedings of the Fourth European Conference on the Use of Modern …, 2010
122010
An improved data error detection technique for dependable embedded software
VB Thati, J Vankeirsbilck, N Penneman, D Pissoort, J Boydens
2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing …, 2018
112018
Effectiveness of data triplication in harsh electromagnetic environments
J Van Waes, J Vankeirsbilck, J Lannoo, D Pissoort, J Boydens
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE …, 2018
112018
Inter-block jump detection techniques: A study
J Vankeirsbilck, VB Thati, H Hallez, J Boydens
2016 XXV International Scientific Conference Electronics (ET), 1-4, 2016
112016
Integration of the European bachelor master degree concept at Belarusian universities for physics and engineering students
J Peuteman, A Janssens, R De Craemer, J Boydens, A Zabasta, ...
2016 XXV International Scientific Conference Electronics (ET), 1-4, 2016
112016
Bluetooth low energy interference awareness scheme and improved channel selection algorithm for connection robustness
B Pang, K T’Jonck, T Claeys, D Pissoort, H Hallez, J Boydens
Sensors 21 (7), 2257, 2021
102021
Effectiveness of frequency diversity to create EM-diversity in triple-modular redundant data transmission systems
J Lannoo, D Vanoost, J Van Waes, J Peuteman, J Boydens, D Pissoort
IEEE Transactions on Electromagnetic Compatibility 63 (3), 702-709, 2020
102020
Resilience of error correction codes against harsh electromagnetic disturbances: Fault elimination for triplication-based error correction codes
J Van Waes, D Vanoost, J Vankeirsbilck, J Lannoo, D Pissoort, J Boydens
IEEE Transactions on Electromagnetic Compatibility 62 (5), 1929-1938, 2020
102020
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