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Jeroen Boydens
Jeroen Boydens
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Random additive signature monitoring for control flow error detection
J Vankeirsbilck, N Penneman, H Hallez, J Boydens
IEEE transactions on Reliability 66 (4), 1178-1192, 2017
652017
Techniques and measures to achieve EMI resilience in mission-or safety-critical systems
D Pissoort, J Lannoo, J Van Waes, A Degraeve, J Boydens
IEEE Electromagnetic Compatibility Magazine 6 (4), 107-114, 2017
412017
Random additive control flow error detection
J Vankeirsbilck, N Penneman, H Hallez, J Boydens
International Conference on Computer Safety, Reliability, and Security, 220-234, 2018
302018
Effectiveness of hamming single error correction codes under harsh electromagnetic disturbances
J Van Waes, J Lannoo, J Vankeirsbilck, A Degraeve, J Peuteman, ...
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE …, 2018
282018
Bluetooth low energy interference awareness scheme and improved channel selection algorithm for connection robustness
B Pang, K T’Jonck, T Claeys, D Pissoort, H Hallez, J Boydens
Sensors 21 (7), 2257, 2021
272021
Selective duplication and selective comparison for data flow error detection
VB Thati, J Vankeirsbilck, J Boydens, D Pissort
2019 4th International Conference on System Reliability and Safety (ICSRS …, 2019
272019
Study on the use of different transmission line termination strategies to obtain EMI-diverse redundant systems
J Lannoo, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
252018
Effectiveness of time diversity to obtain EMI-diverse redundant systems
J Lannoo, J Van Waes, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE …, 2018
242018
Effectiveness of inversion diversity to cope with EMI within a two-channel redundant system
J Lannoo, A Degraeve, D Vanoost, J Boydens, D Pissoort
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
232018
Effectiveness of cyclic redundancy checks under harsh electromagnetic disturbances
J Van Waes, J Lannoo, A Degraeve, D Vanoost, D Pissoort, J Boydens
2017 International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2017
232017
Resilience of error correction codes against harsh electromagnetic disturbances: Fault mechanisms
J Van Waes, D Vanoost, J Vankeirsbilck, J Lannoo, D Pissoort, J Boydens
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1017-1027, 2019
202019
Test-driven development as a reliable embedded software engineering practice
P Cordemans, S Van Landschoot, J Boydens, E Steegmans
Embedded and Real Time System Development: A Software Engineering …, 2013
202013
Optimizing the bluetooth low energy service discovery process
K T’Jonck, B Pang, H Hallez, J Boydens
Sensors 21 (11), 3812, 2021
192021
A study on the impact of the number of devices on communication interference in bluetooth low energy
B Pang, T Claeys, D Pissoort, H Hallez, J Boydens
2020 XXIX International Scientific Conference Electronics (ET), 1-4, 2020
192020
Black & white testing: Bridging black box testing and white box testing
E Steegmans, P Bekaert, F Devos, G Delanote, N Smeets, M van Dooren, ...
Software Testing: Beheers Optimaal de Risico's van IT in uw Business, 1, 2004
182004
Real-time activity tracking using TinyML to support elderly care
K T'Jonck, CR Kancharla, J Vankeirsbilck, H Hallez, J Boydens, B Pang
2021 XXX International Scientific Conference Electronics (ET), 1-6, 2021
162021
An improved data error detection technique for dependable embedded software
VB Thati, J Vankeirsbilck, N Penneman, D Pissoort, J Boydens
2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing …, 2018
162018
Effectiveness of frequency diversity to create EM-diversity in triple-modular redundant data transmission systems
J Lannoo, D Vanoost, J Van Waes, J Peuteman, J Boydens, D Pissoort
IEEE Transactions on Electromagnetic Compatibility 63 (3), 702-709, 2020
152020
Comparative study on AFH techniques in different interference environments
BZ Pang, T Claeys, D Pissoort, H Hallez, J Boydens
2019 IEEE XXVIII International Scientific Conference Electronics (ET), 1-4, 2019
142019
Comparative study on data error detection techniques in embedded systems
VB Thati, J Vankeirsbilck, J Boydens
2016 XXV International Scientific Conference Electronics (ET), 1-4, 2016
142016
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