| In Situ Oxide, GaN Interlayer-Based Vertical Trench MOSFET (OG-FET) on Bulk GaN substrates C Gupta, C Lund, SH Chan, A Agarwal, J Liu, Y Enatsu, S Keller, ... IEEE Electron Device Letters 38 (3), 353-355, 2017 | 161 | 2017 |
| Normally OFF trench CAVET with active Mg-doped GaN as current blocking layer D Ji, MA Laurent, A Agarwal, W Li, S Mandal, S Keller, S Chowdhury IEEE Transactions on Electron Devices 64 (3), 805-808, 2016 | 92 | 2016 |
| 880 V/MIS Gate Trench CAVET on Bulk GaN Substrates D Ji, A Agarwal, H Li, W Li, S Keller, S Chowdhury IEEE Electron Device Letters 39 (6), 863-865, 2018 | 86 | 2018 |
| OG-FET: An In-Situ xide, aN Interlayer-Based Vertical Trench MOSFET C Gupta, SH Chan, Y Enatsu, A Agarwal, S Keller, UK Mishra IEEE Electron Device Letters 37 (12), 1601-1604, 2016 | 78 | 2016 |
| Demonstrating> 1.4 kV OG-FET performance with a novel double field-plated geometry and the successful scaling of large-area devices D Ji, C Gupta, SH Chan, A Agarwal, W Li, S Keller, UK Mishra, ... 2017 IEEE International Electron Devices Meeting (IEDM), 9.4. 1-9.4. 4, 2017 | 71 | 2017 |
| Large-Area In-Situ Oxide, GaN Interlayer-Based Vertical Trench MOSFET (OG-FET) D Ji, C Gupta, A Agarwal, SH Chan, C Lund, W Li, S Keller, UK Mishra, ... IEEE Electron Device Letters 39 (5), 711-714, 2018 | 65 | 2018 |
| Dietary intake and plasma levels of antioxidant vitamins in health and disease: a hospital-based case-control study RB Singh, MA Niaz, S Ghosh, R Beegum, I Bishnoi, P Agarwal, A Agarwal Journal of Nutritional & Environmental Medicine 5 (3), 235-242, 1995 | 60 | 1995 |
| Comparing electrical performance of GaN trench-gate MOSFETs with a-plane and m-plane sidewall channels C Gupta, SH Chan, C Lund, A Agarwal, OS Koksaldi, J Liu, Y Enatsu, ... Applied Physics Express 9 (12), 121001, 2016 | 59 | 2016 |
| Dispersion free 450-V p GaN-gated CAVETs with Mg-ion implanted blocking layer S Mandal, A Agarwal, E Ahmadi, KM Bhat, D Ji, MA Laurent, S Keller, ... IEEE Electron Device Letters 38 (7), 933-936, 2017 | 52 | 2017 |
| First demonstration of AlSiO as gate dielectric in GaN FETs; applied to a high performance OG-FET C Gupta, SH Chan, A Agarwal, N Hatui, S Keller, UK Mishra IEEE Electron Device Letters 38 (11), 1575-1578, 2017 | 42 | 2017 |
| Demonstration of GaN current aperture vertical electron transistors with aperture region formed by ion implantation D Ji, A Agarwal, W Li, S Keller, S Chowdhury IEEE Transactions on Electron Devices 65 (2), 483-487, 2018 | 39 | 2018 |
| Suppression of Mg propagation into subsequent layers grown by MOCVD A Agarwal, M Tahhan, T Mates, S Keller, U Mishra Journal of Applied Physics 121 (2), 2017 | 28 | 2017 |
| Improved Dynamic RON of GaN Vertical Trench MOSFETs (OG-FETs) Using TMAH Wet Etch D Ji, W Li, A Agarwal, SH Chan, J Haller, D Bisi, M Labrecque, C Gupta, ... IEEE Electron Device Letters 39 (7), 1030-1033, 2018 | 27 | 2018 |
| First demonstration of RF N-polar GaN MIS-HEMTs grown on bulk GaN using PAMBE SS Pasayat, E Ahmadi, B Romanczyk, O Koksaldi, A Agarwal, M Guidry, ... Semiconductor Science and Technology 34 (4), 045009, 2019 | 22 | 2019 |
| Controlled low Si doping and high breakdown voltages in GaN on sapphire grown by MOCVD A Agarwal, C Gupta, Y Enatsu, S Keller, U Mishra Semiconductor Science and Technology 31 (12), 125018, 2016 | 19 | 2016 |
| Electro-thermal investigation of GaN vertical trench MOSFETs B Chatterjee, D Ji, A Agarwal, SH Chan, S Chowdhury, S Choi IEEE Electron Device Letters 42 (5), 723-726, 2021 | 15 | 2021 |
| Impact of trench dimensions on the device performance of GaN vertical trench MOSFETs C Gupta, D Ji, SH Chan, A Agarwal, W Leach, S Keller, S Chowdhury, ... IEEE Electron Device Letters 38 (11), 1559-1562, 2017 | 15 | 2017 |
| 1 kV Field-Plated In-Situ Oxide, GaN interlayer based vertical trench MOSFET (OG-FET) C Gupta, A Agarwal, SH Chan, OS Koksaldi, S Keller, UK Mishra Device Research Conference, South Bend, Indiana, 2017 | 14 | 2017 |
| Investigation of Mg -doping for low resistance N-polar p-GaN films grown at reduced temperatures by MOCVD C Lund, A Agarwal, B Romanczyk, T Mates, S Nakamura, S DenBaars, ... Coumpound Semiconductor Week, Boston, 2018 | 13* | 2018 |
| First report of scaling a normally-off In-Situ Oxide, GaN interlayer based vertical trench MOSFET (OG-FET) D Ji, C Gupta, A Agarwal, SH Chan, C Lund, M Laurent, W Li, S Keller, ... Device Research Conference, South Bend, Indiana, 2017 | 11 | 2017 |
Stacia KellerUniversity of California Santa BarbaraVerified email at ece.ucsb.edu
