| New approaches of side-channel attacks based on chip testing methods S Meschkov, DRE Gnad, J Krautter, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 3 | 2022 |
| Is your secure test infrastructure secure enough?: Attacks based on delay test patterns using transient behavior analysis S Meschkov, DRE Gnad, J Krautter, MB Tahoori 2021 IEEE International Test Conference (ITC), 334-338, 2021 | 2 | 2021 |
| Automated Masking of FPGA-Mapped Designs N Muller, S Meschkov, DRE Gnad, MB Tahoori, A Moradi 2023 33rd International Conference on Field-Programmable Logic and …, 2023 | 1 | 2023 |
| Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies B Sapui, J Krautter, M Mayahinia, A Jafari, D Gnad, S Meschkov, ... 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 1 | 2023 |
| Enabling In-Field Parametric Testing for RISC-V Cores SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE International Test Conference (ITC), 367-376, 2023 | | 2023 |
| SLM ISA and Hardware Extensions for RISC-V Processors SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE 29th International Symposium on On-Line Testing and Robust System …, 2023 | | 2023 |
| JitSCA: Jitter-based Side-Channel Analysis in Picoscale Resolution K Schoos, S Meschkov, MB Tahoori, DRE Gnad IACR Transactions on Cryptographic Hardware and Embedded Systems 2023 (3 …, 2023 | | 2023 |
Dennis GnadPostdoctoral Researcher, Karlsruhe Institute of TechnologyGeverifieerd e-mailadres voor kit.edu
