| Variation-aware deterministic ATPG M Sauer, I Polian, ME Imhof, A Mumtaz, E Schneider, A Czutro, ... 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 17 | 2014 |
| Variation-aware fault grading A Czutro, ME Imhof, J Jiang, A Mumtaz, M Sauer, B Becker, I Polian, ... 2012 IEEE 21st Asian Test Symposium, 344-349, 2012 | 15 | 2012 |
| P-PET: Partial pseudo-exhaustive test for high defect coverage A Mumtaz, ME Imhof, HJ Wunderlich 2011 IEEE International Test Conference, 1-8, 2011 | 11 | 2011 |
| Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test A Cook, S Hellebrand, ME Imhof, A Mumtaz, HJ Wunderlich 2012 13th Latin American Test Workshop (LATW), 1-4, 2012 | 3 | 2012 |
| Online Test and Diagnosis WU Yang, A Mumtaz, HJ Wunderlich Seminar on Reconfigurable Hardware Architectures July, 2012 | 1 | 2012 |
| Embedded Test for Highly Accurate Defect Localization A Mumtaz, ME Imhof, S Holst, HJ Wunderlich 2011 Asian Test Symposium, 213-218, 2011 | 1 | 2011 |
| On-Chip Structures for Parametric Test AC Test, S Hellebrand, M Imhof, A Mumtaz, HJ Wunderlich, ... | | |
| ETS 2014 Best Paper M Sauer, I Polian, ME Imhof, A Mumtaz, E Schneider, A Czutro, ... | | |
| LATW2012 A Mumtaz, A Cansian, A Rekik, AD Junior, A Cook, AHJ Wunderlich, ... | | |
| Eingebetteter Test zur hochgenauen Defekt-Lokalisierung A Mumtaz, ME Imhof, S Holst, HJ Wunderlich | | |
| Mixed-Mode-Mustererzeugung fur hohe Defekterfassung beim Eingebetteten Test A Mumtaz, ME Imhof, HJ Wunderlich | | |
Michael E. ImhofUniversity of StuttgartVerified email at iti.uni-stuttgart.de
