Dan Alexandrescu
Dan Alexandrescu
IROC Technologies
Geverifieerd e-mailadres voor iroctech.com
TitelGeciteerd doorJaar
Evaluation of a soft error tolerance technique based on time and/or space redundancy
L Anghel, D Alexandrescu, M Nicolaidis
Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000
1472000
Low-cost highly-robust hardened cells using blocking feedback transistors
M Nicolaidis, R Perez, D Alexandrescu
26th IEEE VLSI Test Symposium (vts 2008), 371-376, 2008
942008
New methods for evaluating the impact of single event transients in VDSM ICs
D Alexandrescu, L Anghel, M Nicolaidis
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002
892002
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales
M Ebrahimi, A Evans, MB Tahoori, R Seyyedi, E Costenaro, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
512014
Comprehensive analysis of sequential and combinational soft errors in an embedded processor
M Ebrahimi, A Evans, MB Tahoori, E Costenaro, D Alexandrescu, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
452015
Design for soft error resiliency in internet core routers
AL Silburt, A Evans, I Perryman, SJ Wen, D Alexandrescu
IEEE Transactions on Nuclear Science 56 (6), 3551-3555, 2009
392009
Simulating single event transients in VDSM ICs for ground level radiation
D Alexandrescu, L Anghel, M Nicolaidis
Journal of Electronic Testing 20 (4), 413-421, 2004
362004
Study of neutron soft error rate (SER) sensitivity: investigation of upset mechanisms by comparative simulation of FinFET and planar MOSFET SRAMs
J Noh, V Correas, S Lee, J Jeon, I Nofal, J Cerba, H Belhaddad, ...
IEEE Transactions on Nuclear Science 62 (4), 1642-1649, 2015
322015
A practical approach to single event transient analysis for highly complex design
E Costenaro, D Alexandrescu, K Belhaddad, M Nicolaidis
Journal of Electronic Testing 29 (3), 301-315, 2013
262013
A practical approach to single event transients analysis for highly complex designs
D Alexandrescu, E Costenaro, M Nicolaidis
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
262011
A comprehensive soft error analysis methodology for SoCs/ASICs memory instances
D Alexandrescu
2011 IEEE 17th International On-Line Testing Symposium, 175-176, 2011
262011
Hierarchical RTL-based combinatorial SER estimation
A Evans, D Alexandrescu, E Costenaro, L Chen
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 139-144, 2013
252013
A systematical method of quantifying SEU FIT
SJ Wen, D Alexandrescu, R Perez
2008 14th IEEE International On-Line Testing Symposium, 109-114, 2008
212008
Riif-reliability information interchange format
A Evans, M Nicolaidis, SJ Wen, D Alexandrescu, E Costenaro
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 103-108, 2012
202012
Towards optimized functional evaluation of SEE-induced failures in complex designs
D Alexandrescu, E Costenaro
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 182-187, 2012
192012
Detailed SET measurement and characterization of a 65 nm bulk technology
M Glorieux, A Evans, V Ferlet-Cavrois, C Boatella-Polo, D Alexandrescu, ...
IEEE Transactions on Nuclear Science 64 (1), 81-88, 2016
182016
New techniques for SET sensitivity and propagation measurement in flash-based FPGAs
A Evans, D Alexandrescu, V Ferlet-Cavrois, M Nicolaidis
IEEE Transactions on Nuclear Science 61 (6), 3171-3177, 2014
182014
A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance
S Ganapathy, R Canal, D Alexandrescu, E Costenaro, A Gonzalez, ...
2012 IEEE 30th International Conference on Computer Design (ICCD), 472-477, 2012
152012
Logic synthesis and testing techniques for switching nano-crossbar arrays
D Alexandrescu, M Altun, L Anghel, A Bernasconi, V Ciriani, L Frontini, ...
Microprocessors and Microsystems 54, 14-25, 2017
132017
A multi-partner soft error rate analysis of an infiniband host channel adapter
H Chapman, E Landman, A Margalit-Ilovich, Y Fang, AS Oates, ...
Proceedings of, 2010
122010
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