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Flavio Canavero
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Stability, causality, and passivity in electrical interconnect models
P Triverio, S Grivet-Talocia, MS Nakhla, FG Canavero, R Achar
IEEE Transactions on Advanced Packaging 30 (4), 795-808, 2007
3202007
Overview of signal integrity and EMC design technologies on PCB: Fundamentals and latest progress
TL Wu, F Buesink, F Canavero
IEEE transactions on electromagnetic compatibility 55 (4), 624-638, 2013
2492013
Transient analysis of lossy transmission lines: An efficient approach based on the method of characteristics
S Grivet-Talocia, HM Huang, AE Ruehli, F Canavero, IM Elfadel
IEEE Transactions on Advanced Packaging 27 (1), 45-56, 2004
1712004
Accurate extraction of noise source impedance of an SMPS under operating conditions
V Tarateeraseth, B Hu, KY See, FG Canavero
IEEE Transactions on Power Electronics 25 (1), 111-117, 2009
1382009
Stochastic analysis of multiconductor cables and interconnects
IS Stievano, P Manfredi, FG Canavero
IEEE transactions on electromagnetic compatibility 53 (2), 501-507, 2011
1322011
Generalized decoupled polynomial chaos for nonlinear circuits with many random parameters
P Manfredi, DV Ginste, D De Zutter, FG Canavero
IEEE Microwave and Wireless Components Letters 25 (8), 505-507, 2015
1232015
Systematic electromagnetic interference filter design based on information from in-circuit impedance measurements
V Tarateeraseth, KY See, FG Canavero, RWY Chang
IEEE Transactions on Electromagnetic Compatibility 52 (3), 588-598, 2010
1232010
Parameters variability effects on multiconductor interconnects via Hermite polynomial chaos
IS Stievano, P Manfredi, FG Canavero
IEEE Transactions on Components, Packaging and Manufacturing Technology 1 (8 …, 2011
1202011
M/spl pi/log, macromodeling via parametric identification of logic gates
IS Stievano, IA Maio, FG Canavero
IEEE Transactions on Advanced Packaging 27 (1), 15-23, 2004
1192004
Parametric macromodels of digital I/O ports
IS Stievano, IA Maio, FG Canavero
IEEE Transactions on Advanced Packaging 25 (2), 255-264, 2002
1182002
Stochastic modeling-based variability analysis of on-chip interconnects
DV Ginste, D De Zutter, D Deschrijver, T Dhaene, P Manfredi, F Canavero
IEEE Transactions on Components, Packaging and Manufacturing Technology 2 (7 …, 2012
1142012
Machine learning and uncertainty quantification for surrogate models of integrated devices with a large number of parameters
R Trinchero, M Larbi, HM Torun, FG Canavero, M Swaminathan
IEEE Access 7, 4056-4066, 2018
952018
Stochastic transmission line analysis via polynomial chaos methods: An overview
P Manfredi, DV Ginste, IS Stievano, D De Zutter, FG Canavero
IEEE Electromagnetic Compatibility Magazine 6 (3), 77-84, 2017
902017
Analysis of crosstalk and field coupling to lossy MTLs in a SPICE environment
I Maio, FG Canavero, B Dilecce
IEEE Transactions on Electromagnetic Compatibility 38 (3), 221-229, 1996
821996
Theoretical assessment of bulk current injection versus radiation
S Pignari, FG Canavero
IEEE Transactions on Electromagnetic compatibility 38 (3), 469-477, 1996
811996
Machine learning for the performance assessment of high-speed links
R Trinchero, P Manfredi, IS Stievano, FG Canavero
IEEE Transactions on Electromagnetic Compatibility 60 (6), 1627-1634, 2018
692018
Uncertainty assessment of lossy and dispersive lines in SPICE-type environments
P Manfredi, DV Ginste, D De Zutter, FG Canavero
IEEE Transactions on Components, Packaging and Manufacturing Technology 3 (7 …, 2013
662013
Stochastic modeling of nonlinear circuits via SPICE-compatible spectral equivalents
P Manfredi, DV Ginste, D De Zutter, FG Canavero
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (7), 2057-2065, 2014
642014
Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components
P Manfredi, FG Canavero
IEEE Transactions on Microwave Theory and Techniques 63 (5), 1502-1511, 2015
552015
Polynomial chaos for random field coupling to transmission lines
P Manfredi, FG Canavero
IEEE Transactions on Electromagnetic Compatibility 54 (3), 677-680, 2012
542012
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