Asif Khan
Asif Khan
Assistant Professor, School of Electrical and Computer Engineering, Georgia Institute of Technology
Geverifieerd e-mailadres voor ece.gatech.edu - Homepage
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Negative capacitance in a ferroelectric capacitor
AI Khan, K Chatterjee, B Wang, S Drapcho, L You, C Serrao, SR Bakaul, ...
Nature materials 14 (2), 182, 2015
5122015
Experimental evidence of ferroelectric negative capacitance in nanoscale heterostructures
AI Khan, D Bhowmik, P Yu, SJ Kim, X Pan, R Ramesh, S Salahuddin
Applied Physics Letters 99 (11), 113501, 2011
2942011
Ferroelectric negative capacitance MOSFET: Capacitance tuning & antiferroelectric operation
AI Khan, CW Yeung, C Hu, S Salahuddin
Electron Devices Meeting (IEDM), 2011 IEEE International, 11.3. 1-11.3. 4, 2011
2792011
Negative Capacitance in Short Channel FinFETs Externally Connected to An Epitaxial Ferroelectric Capacitor
A Islam Khan, K Chatterjee, JP Duarte, Z Lu, A Sachid, S Khandelwal, ...
IEEE Electron Device Letters 37 (1), 111 - 114, 2016
175*2016
Direct Observation of Negative Capacitance in Polycrystalline Ferroelectric HfO2
M Hoffmann, M Pešić, K Chatterjee, AI Khan, S Salahuddin, S Slesazeck, ...
Advanced Functional Materials, 2016
1632016
Spatially resolved steady-state negative capacitance
AK Yadav, KX Nguyen, Z Hong, P García-Fernández, P Aguado-Puente, ...
Nature, 1, 2019
1332019
Room-temperature negative capacitance in a ferroelectric–dielectric superlattice heterostructure
W Gao, A Khan, X Marti, C Nelson, C Serrao, J Ravichandran, R Ramesh, ...
Nano letters 14 (10), 5814-5819, 2014
1172014
Effects of the Variation of Ferroelectric Properties on Negative Capacitance FET Characteristics
CI Lin, AI Khan, S Salahuddin, C Hu
IEEE Transactions on Electron Devices 63 (5), 2197 - 2199, 2016
1032016
Single Crystal Functional Oxides on Silicon
SR Bakaul, CR Serrao, M Lee, CW Yeung, A Sarker, SL Hsu, A Yadav, ...
Nature Communications, 10547, 2016
902016
Negative Capacitance Behavior in a Leaky Ferroelectric
AI Khan, U Radhakrishna, K Chatterjee, S Salahuddin, DA Antoniadis
IEEE Transactions on Electron Devices 63 (11), 4416-4422, 2016
812016
Nonvolatile memory design based on ferroelectric FETs
S George, K Ma, A Aziz, X Li, A Khan, S Salahuddin, MF Chang, S Datta, ...
Design Automation Conference (DAC), 2016 53nd ACM/EDAC/IEEE, 1-6, 2016
782016
Compact models of negative-capacitance FinFETs: Lumped and distributed charge models
JP Duarte, S Khandelwal, AI Khan, A Sachid, YK Lin, HL Chang, ...
Electron Devices Meeting (IEDM), 2016 IEEE International, 30.5. 1-30.5. 4, 2016
682016
Impact of Parasitic Capacitance and Ferroelectric Parameters on Negative Capacitance FinFET Characteristics
S Khandelwal, JP Duarte, AI Khan, S Salahuddin, C Hu
IEEE Electron Device Letters 38 (1), 142-144, 2017
612017
Low power negative capacitance FETs for future quantum-well body technology
CW Yeung, AI Khan, A Sarker, S Salahuddin, C Hu
VLSI Technology, Systems, and Applications (VLSI-TSA), 2013 International …, 2013
572013
Self-Aligned, Gate Last, FDSOI, Ferroelectric Gate Memory Device With 5.5-nm Hf0.8Zr0.2O2, High Endurance and Breakdown Recovery
K Chatterjee, S Kim, G Karbasian, AJ Tan, AK Yadav, AI Khan, C Hu, ...
IEEE Electron Device Letters 38 (10), 1379-1382, 2017
562017
Enabling Energy-Efficient Nonvolatile Computing With Negative Capacitance FET
X Li, J Sampson, A Khan, K Ma, S George, A Aziz, SK Gupta, ...
IEEE Transactions on Electron Devices 64 (8), 3452-3458, 2017
552017
Dense Electron System from Gate-Controlled Surface Metal–Insulator Transition
K Liu, D Fu, J Cao, J Suh, KX Wang, C Cheng, DF Ogletree, H Guo, ...
Nano letters 12 (12), 6272-6277, 2012
552012
Voltage induced magnetostrictive switching of nanomagnets: Strain assisted strain transfer torque random access memory
A Khan, DE Nikonov, S Manipatruni, T Ghani, IA Young
Applied Physics Letters 104 (26), 262407, 2014
522014
0.2 V adiabatic NC-FinFET with 0.6 mA/µm I ON and 0.1 nA/µm I OFF
C Hu, S Salahuddin, CI Lin, A Khan
Device Research Conference (DRC), 2015 73rd Annual, 39-40, 2015
51*2015
Work function engineering for performance improvement in leaky negative capacitance FETs
AI Khan, U Radhakrishna, S Salahuddin, D Antoniadis
IEEE Electron Device Letters 38 (9), 1335-1338, 2017
482017
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Artikelen 1–20