Innocent Agbo
Innocent Agbo
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Bias temperature instability analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
552014
Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier
I Agbo, M Taouil, D Kraak, S Hamdioui, H Kükner, P Weckx, P Raghavan, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2017
282017
Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability
I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ...
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 725-730, 2016
202016
BTI impact on SRAM sense amplifier
I Agbo, S Khan, S Hamdioui
2013 8th IEEE Design and Test Symposium, 1-6, 2013
162013
Mitigation of sense amplifier degradation using input switching
D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ...
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
142017
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
I Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, ...
2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015
132015
Impact and mitigation of sense amplifier aging degradation using realistic workloads
D Kraak, M Taouil, I Agbo, S Hamdioui, P Weckx, S Cosemans, F Catthoor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (12 …, 2017
112017
Degradation analysis of high performance 14nm finfet sram
D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 201-206, 2018
102018
Comparative BTI analysis for various sense amplifier designs
I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ...
2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016
102016
BTI analysis of SRAM write driver
I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor
2015 10th International Design & Test Symposium (IDT), 100-105, 2015
92015
Read path degradation analysis in SRAM
I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ...
2016 21th IEEE European Test Symposium (ETS), 1-2, 2016
82016
Methodology for application-dependent degradation analysis of memory timing
D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 162-167, 2019
42019
Comparative analysis of rd and atomistic trap-based bti models on sram sense amplifier
I Agbo, M Taouil, S Hamdioui, S Cosemans, P Weckx, P Raghavan, ...
2015 10th International Conference on Design & Technology of Integrated …, 2015
42015
Impact and mitigation of SRAM read path aging
I Agbo, M Taouil, D Kraak, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ...
Microelectronics Reliability 87, 158-167, 2018
32018
Implementable building blocks for fluctuation based calculation in single electron tunneling technology
I Agbo, S Safiruddin, S Cotofana
2009 9th IEEE Conference on Nanotechnology (IEEE-NANO), 366-369, 2009
32009
Hardware-based aging mitigation scheme for memory address decoder
D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor
2019 IEEE European Test Symposium (ETS), 1-6, 2019
22019
Parametric and functional degradation analysis of complete 14-nm finfet sram
D Kraak, M Taouil, I Agbo, S Hamdioui, P Weckx, S Cosemans, F Catthoor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (6 …, 2019
22019
Comparative BTI impact for SRAM cell and sense amplifier designs
I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ...
MEDIAN Finale-Workshop on Manufacturable and Dependable Multicore …, 2015
22015
BTI analysis for high performance and low power SRAM sense amplifier designs
I Agbo, M Taouil, S Hamdioui, P Weckx, P Raghavan, F Catthoor
4th MEDIAN Project Workshop (organised as a DATE 2015 Friday Workshop), 2015
22015
Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
I Agbo, M Taouil, D Kraak, S Hamdioui, P Weckx, S Cosemans, ...
Microelectronics Reliability 99, 52-61, 2019
12019
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