| Gas-assisted focused electron beam and ion beam processing and fabrication I Utke, P Hoffmann, J Melngailis Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008 | 1174 | 2008 |
| A snake-based approach to accurate determination of both contact points and contact angles AF Stalder, G Kulik, D Sage, L Barbieri, P Hoffmann Colloids and surfaces A: physicochemical and engineering aspects 286 (1-3 …, 2006 | 957 | 2006 |
| Water wetting transition parameters of perfluorinated substrates with periodically distributed flat-top microscale obstacles L Barbieri, E Wagner, P Hoffmann Langmuir 23 (4), 1723-1734, 2007 | 399 | 2007 |
| Comparison of mechanically drawn and protection layer chemically etched optical fiber tips P Hoffmann, B Dutoit, RP Salathé Ultramicroscopy 61 (1-4), 165-170, 1995 | 394 | 1995 |
| Focused electron beam induced deposition of gold I Utke, P Hoffmann, B Dwir, K Leifer, E Kapon, P Doppelt Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 210 | 2000 |
| High-resolution magnetic Co supertips grown by a focused electron beam I Utke, P Hoffmann, R Berger, L Scandella Applied physics letters 80 (25), 4792-4794, 2002 | 203 | 2002 |
| AFM study of perfluoroalkylsilane and alkylsilane self-assembled monolayers for anti-stiction in MEMS/NEMS B Bhushan, T Kasai, G Kulik, L Barbieri, P Hoffmann Ultramicroscopy 105 (1-4), 176-188, 2005 | 166 | 2005 |
| Phosphonate self-assembled monolayers on aluminum surfaces E Hoque, JA DeRose, P Hoffmann, HJ Mathieu, B Bhushan, M Cichomski The Journal of chemical physics 124 (17), 174710, 2006 | 138 | 2006 |
| Submicrometer Hall devices fabricated by focused electron-beam-induced deposition G Boero, I Utke, T Bret, N Quack, M Todorova, S Mouaziz, P Kejik, ... Applied Physics Letters 86 (4), 042503, 2005 | 134 | 2005 |
| Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals I Utke, A Luisier, P Hoffmann, D Laub, PA Buffat Applied Physics Letters 81 (17), 3245-3247, 2002 | 123 | 2002 |
| Alkylphosphonate modified aluminum oxide surfaces E Hoque, JA DeRose, G Kulik, P Hoffmann, HJ Mathieu, B Bhushan The Journal of Physical Chemistry B 110 (22), 10855-10861, 2006 | 119 | 2006 |
| High‐resolution nanoimprinting with a robust and reusable polymer mold DR Barbero, MSM Saifullah, P Hoffmann, HJ Mathieu, D Anderson, ... Advanced Functional Materials 17 (14), 2419-2425, 2007 | 117 | 2007 |
| Vapor phase self-assembly of fluorinated monolayers on silicon and germanium oxide PW Hoffmann, M Stelzle, JF Rabolt Langmuir 13 (7), 1877-1880, 1997 | 114 | 1997 |
| Gold elliptical nanoantennas as probes for near field optical microscopy O Sqalli, I Utke, P Hoffmann, F Marquis-Weible Journal of applied physics 92 (2), 1078-1083, 2002 | 105 | 2002 |
| Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold T Brintlinger, MS Fuhrer, J Melngailis, I Utke, T Bret, A Perentes, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 102 | 2005 |
| Alkylperfluorosilane self-assembled monolayers on aluminum: A comparison with alkylphosphonate self-assembled monolayers E Hoque, JA DeRose, P Hoffmann, B Bhushan, HJ Mathieu The Journal of Physical Chemistry C 111 (10), 3956-3962, 2007 | 100 | 2007 |
| Micro∕ nanotribological study of perfluorosilane SAMs for antistiction and low wear T Kasai, B Bhushan, G Kulik, L Barbieri, P Hoffmann Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 92 | 2005 |
| Cross Section Investigations of Compositions and Sub‐Structures of Tips Obtained by Focused Electron Beam Induced Deposition I Utke, J Michler, PH Gasser, C Santschi, D Laub, M Cantoni, PA Buffat, ... Advanced Engineering Materials 7 (5), 323-331, 2005 | 89 | 2005 |
| Effect of surface texturing on cast iron reciprocating against steel under starved lubrication conditions: A parametric study F Saeidi, B Meylan, P Hoffmann, K Wasmer Wear 348, 17-26, 2016 | 86 | 2016 |
| FTIR and XPS investigation of Er-doped SiO2–TiO2 films Q Fang, M Meier, JJ Yu, ZM Wang, JY Zhang, JX Wu, A Kenyon, ... Materials Science and Engineering: B 105 (1-3), 209-213, 2003 | 83 | 2003 |
Ivo UtkePhD, Empa-Swiss Federal Laboratories for Materials Science and TechnologyVerified email at empa.ch
