| Fundamental variability limits of filament-based RRAM A Grossi, E Nowak, C Zambelli, C Pellissier, S Bernasconi, G Cibrario, ... 2016 IEEE International Electron Devices Meeting (IEDM), 4.7. 1-4.7. 4, 2016 | 135 | 2016 |
| Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM A Grossi, E Vianello, C Zambelli, P Royer, JP Noel, B Giraud, L Perniola, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018 | 71 | 2018 |
| Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ... IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015 | 69 | 2015 |
| Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications A Grossi, E Vianello, MM Sabry, M Barlas, L Grenouillet, J Coignus, ... IEEE Transactions on Electron Devices 66 (3), 1281-1288, 2019 | 64 | 2019 |
| Resistive RAM with multiple bits per cell: Array-level demonstration of 3 bits per cell BQ Le, A Grossi, E Vianello, T Wu, G Lama, E Beigne, HSP Wong, S Mitra IEEE Transactions on Electron Devices 66 (1), 641-646, 2018 | 62 | 2018 |
| Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms E Pérez, A Grossi, C Zambelli, P Olivo, R Roelofs, C Wenger IEEE Electron Device Letters 38 (2), 175-178, 2016 | 62 | 2016 |
| Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ... Solid-State Electronics 115, 17-25, 2016 | 55 | 2016 |
| Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices A Grossi, E Perez, C Zambelli, P Olivo, E Miranda, R Roelofs, J Woodruff, ... Scientific reports 8 (1), 11160, 2018 | 40 | 2018 |
| Statistical analysis of resistive switching characteristics in ReRAM test arrays C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ... 2014 International Conference on Microelectronic Test Structures (ICMTS), 27-31, 2014 | 37 | 2014 |
| Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays E Pérez, A Grossi, C Zambelli, P Olivo, C Wenger IEEE Journal of the Electron Devices Society 5 (1), 64-68, 2016 | 34 | 2016 |
| Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data T Werner, E Vianello, O Bichler, A Grossi, E Nowak, JF Nodin, B Yvert, ... 2016 IEEE International Electron Devices Meeting (IEDM), 16.6. 1-16.6. 4, 2016 | 30 | 2016 |
| Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ... 2015 IEEE International Memory Workshop (IMW), 1-4, 2015 | 29 | 2015 |
| Role of synaptic variability in resistive memory-based spiking neural networks with unsupervised learning DRB Ly, A Grossi, C Fenouillet-Beranger, E Nowak, D Querlioz, ... Journal of Physics D: Applied Physics 51 (44), 444002, 2018 | 26 | 2018 |
| In-depth characterization of resistive memory-based ternary content addressable memories DRB Ly, B Giraud, JP Noël, A Grossi, N Castellani, G Sassine, JF Nodin, ... 2018 IEEE International Electron Devices Meeting (IEDM), 20.3. 1-20.3. 4, 2018 | 25 | 2018 |
| Reliability of 3D NAND flash memories A Grossi, C Zambelli, P Olivo 3D Flash Memories, 29-62, 2016 | 24 | 2016 |
| Electrical characterization of read window in ReRAM arrays under different SET/RESET cycling conditions C Zambelli, A Grossi, P Olivo, D Walczyk, J Dabrowski, B Tillack, ... 2014 IEEE 6th International Memory Workshop (IMW), 1-4, 2014 | 23 | 2014 |
| Quality-of-service implications of enhanced program algorithms for charge-trapping NAND in future solid-state drives A Grossi, L Zuolo, F Restuccia, C Zambelli, P Olivo IEEE Transactions on Device and Materials Reliability 15 (3), 363-369, 2015 | 19 | 2015 |
| Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 A Grossi, E Perez, C Zambelli, P Olivo, C Wenger 2016 Joint International EUROSOI Workshop and International Conference on …, 2016 | 17 | 2016 |
| RRAM reliability/performance characterization through array architectures investigations C Zambelli, A Grossi, P Olivo, C Walczyk, C Wenger 2015 IEEE Computer Society Annual Symposium on VLSI, 327-332, 2015 | 17 | 2015 |
| Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 A Grossi, C Zambelli, P Olivo, A Crespo-Yepes, J Martin-Martinez, ... Solid-State Electronics 128, 187-193, 2017 | 15 | 2017 |
Cristian ZambelliAssociate Professor, University of FerraraVerified email at unife.it
