| A 2.6 nW, 0.45 V temperature-compensated subthreshold CMOS voltage reference L Magnelli, F Crupi, P Corsonello, C Pace, G Iannaccone IEEE Journal of Solid-State Circuits 46 (2), 465-474, 2010 | 318 | 2010 |
| Australian standards of care and treatment guidelines for transgender and gender diverse children and adolescents MM Telfer, MA Tollit, CC Pace, KC Pang Medical Journal of Australia 209 (3), 132-136, 2018 | 185 | 2018 |
| Evolution of depression and anxiety symptoms in parents of very preterm infants during the newborn period CC Pace, AJ Spittle, CML Molesworth, KJ Lee, EA Northam, JLY Cheong, ... Jama Pediatrics 170 (9), 863-870, 2016 | 181 | 2016 |
| Noise in Drain and Gate Current of MOSFETs With High- Gate Stacks P Magnone, F Crupi, G Giusi, C Pace, E Simoen, C Claeys, L Pantisano, ... IEEE Transactions on Device and Materials Reliability 9 (2), 180-189, 2009 | 131 | 2009 |
| Embedded DSP-based telehealth radar system for remote in-door fall detection C Garripoli, M Mercuri, P Karsmakers, PJ Soh, G Crupi, ... IEEE journal of biomedical and health informatics 19 (1), 92-101, 2014 | 103 | 2014 |
| Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics G Giusi, F Crupi, C Pace, C Ciofi, G Groeseneken IEEE Transactions on Electron Devices 53 (4), 823-828, 2006 | 69 | 2006 |
| Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks F Crupi, P Srinivasan, P Magnone, E Simoen, C Pace, D Misra, C Claeys IEEE Electron Device Letters 27 (8), 688-691, 2006 | 67 | 2006 |
| Neurobehaviour between birth and 40 weeks’ gestation in infants born< 30 weeks’ gestation and parental psychological wellbeing: predictors of brain development and child outcomes AJ Spittle, DK Thompson, NC Brown, K Treyvaud, JLY Cheong, KJ Lee, ... BMC pediatrics 14 (1), 1-13, 2014 | 66 | 2014 |
| Humidity sensing properties of Li–iron oxide based thin films G Neri, A Bonavita, S Galvagno, C Pace, S Patanč, A Arena Sensors and Actuators B: Chemical 73 (2-3), 89-94, 2001 | 53 | 2001 |
| Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics F Crupi, C Pace, G Cocorullo, G Groeseneken, M Aoulaiche, M Houssa Microelectronic engineering 80, 130-133, 2005 | 52 | 2005 |
| Least square regression method for estimating gas concentration in an electronic nose system W Khalaf, C Pace, M Gaudioso Sensors 9 (3), 1678-1691, 2009 | 48 | 2009 |
| New generation non-stationary portable neutron generators for biophysical applications of Neutron Activation Analysis N Marchese, A Cannuli, MT Caccamo, C Pace Biochimica et Biophysica Acta (BBA)-General Subjects 1861 (1), 3661-3670, 2017 | 44 | 2017 |
| Matching performance of FinFET devices with fin widths down to 10 nm P Magnone, A Mercha, V Subramanian, P Parvais, N Collaert, M Dehan, ... IEEE electron device letters 30 (12), 1374-1376, 2009 | 43 | 2009 |
| How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier C Ciofi, F Crupi, C Pace, G Scandurra IEEE transactions on instrumentation and measurement 55 (3), 814-819, 2006 | 41 | 2006 |
| Influence of fathers' early parenting on the development of children born very preterm and full term GE McMahon, MM Spencer-Smith, CC Pace, AJ Spittle, P Stedall, ... The Journal of pediatrics 205, 195-201, 2019 | 38 | 2019 |
| Room-temperature single-electron effects in silicon nanocrystal memories C Pace, F Crupi, S Lombardo, C Gerardi, G Cocorullo Applied Physics Letters 87 (18), 182106, 2005 | 36 | 2005 |
| Analytical model for the noise in the tunneling current through metal-oxide-semiconductor structures F Crupi, G Giusi, G Iannaccone, P Magnone, C Pace, E Simoen, C Claeys Journal of Applied Physics 106 (7), 073710, 2009 | 33 | 2009 |
| A new method for high sensitivity noise measurements C Ciofi, F Crupi, C Pace IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001 | 32 | 2001 |
| A new circuit topology for the realization of very low-noise wide-bandwidth transimpedance amplifier C Ciofi, F Crupi, C Pace, G Scandurra, M Patanč IEEE Transactions on Instrumentation and Measurement 56 (5), 1626-1631, 2007 | 31 | 2007 |
| Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices P Magnone, V Subramanian, B Parvais, A Mercha, C Pace, M Dehan, ... Microelectronic Engineering 85 (8), 1728-1731, 2008 | 29 | 2008 |
