Calogero Pace
Calogero Pace
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A 2.6 nW, 0.45 V temperature-compensated subthreshold CMOS voltage reference
L Magnelli, F Crupi, P Corsonello, C Pace, G Iannaccone
IEEE Journal of Solid-State Circuits 46 (2), 465-474, 2010
Australian standards of care and treatment guidelines for transgender and gender diverse children and adolescents
MM Telfer, MA Tollit, CC Pace, KC Pang
Medical Journal of Australia 209 (3), 132-136, 2018
Evolution of depression and anxiety symptoms in parents of very preterm infants during the newborn period
CC Pace, AJ Spittle, CML Molesworth, KJ Lee, EA Northam, JLY Cheong, ...
Jama Pediatrics 170 (9), 863-870, 2016
Noise in Drain and Gate Current of MOSFETs With High- Gate Stacks
P Magnone, F Crupi, G Giusi, C Pace, E Simoen, C Claeys, L Pantisano, ...
IEEE Transactions on Device and Materials Reliability 9 (2), 180-189, 2009
Embedded DSP-based telehealth radar system for remote in-door fall detection
C Garripoli, M Mercuri, P Karsmakers, PJ Soh, G Crupi, ...
IEEE journal of biomedical and health informatics 19 (1), 92-101, 2014
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics
G Giusi, F Crupi, C Pace, C Ciofi, G Groeseneken
IEEE Transactions on Electron Devices 53 (4), 823-828, 2006
Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks
F Crupi, P Srinivasan, P Magnone, E Simoen, C Pace, D Misra, C Claeys
IEEE Electron Device Letters 27 (8), 688-691, 2006
Neurobehaviour between birth and 40 weeks’ gestation in infants born< 30 weeks’ gestation and parental psychological wellbeing: predictors of brain development and child outcomes
AJ Spittle, DK Thompson, NC Brown, K Treyvaud, JLY Cheong, KJ Lee, ...
BMC pediatrics 14 (1), 1-13, 2014
Humidity sensing properties of Li–iron oxide based thin films
G Neri, A Bonavita, S Galvagno, C Pace, S Patanč, A Arena
Sensors and Actuators B: Chemical 73 (2-3), 89-94, 2001
Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics
F Crupi, C Pace, G Cocorullo, G Groeseneken, M Aoulaiche, M Houssa
Microelectronic engineering 80, 130-133, 2005
Least square regression method for estimating gas concentration in an electronic nose system
W Khalaf, C Pace, M Gaudioso
Sensors 9 (3), 1678-1691, 2009
New generation non-stationary portable neutron generators for biophysical applications of Neutron Activation Analysis
N Marchese, A Cannuli, MT Caccamo, C Pace
Biochimica et Biophysica Acta (BBA)-General Subjects 1861 (1), 3661-3670, 2017
Matching performance of FinFET devices with fin widths down to 10 nm
P Magnone, A Mercha, V Subramanian, P Parvais, N Collaert, M Dehan, ...
IEEE electron device letters 30 (12), 1374-1376, 2009
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier
C Ciofi, F Crupi, C Pace, G Scandurra
IEEE transactions on instrumentation and measurement 55 (3), 814-819, 2006
Influence of fathers' early parenting on the development of children born very preterm and full term
GE McMahon, MM Spencer-Smith, CC Pace, AJ Spittle, P Stedall, ...
The Journal of pediatrics 205, 195-201, 2019
Room-temperature single-electron effects in silicon nanocrystal memories
C Pace, F Crupi, S Lombardo, C Gerardi, G Cocorullo
Applied Physics Letters 87 (18), 182106, 2005
Analytical model for the noise in the tunneling current through metal-oxide-semiconductor structures
F Crupi, G Giusi, G Iannaccone, P Magnone, C Pace, E Simoen, C Claeys
Journal of Applied Physics 106 (7), 073710, 2009
A new method for high sensitivity noise measurements
C Ciofi, F Crupi, C Pace
IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001
A new circuit topology for the realization of very low-noise wide-bandwidth transimpedance amplifier
C Ciofi, F Crupi, C Pace, G Scandurra, M Patanč
IEEE Transactions on Instrumentation and Measurement 56 (5), 1626-1631, 2007
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
P Magnone, V Subramanian, B Parvais, A Mercha, C Pace, M Dehan, ...
Microelectronic Engineering 85 (8), 1728-1731, 2008
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