Gerd Vandersteen
Gerd Vandersteen
Vrije Universiteit Brussel
Verified email at vub.be
TitleCited byYear
Frequency domain system identification using arbitrary signals
R Pintelon, J Schoukens, G Vandersteen
IEEE Transactions on Automatic Control 42 (12), 1717-1720, 1997
1731997
Estimation of nonparametric noise and FRF models for multivariable systems—Part I: Theory
R Pintelon, J Schoukens, G Vandersteen, K Barbé
Mechanical Systems and Signal Processing 24 (3), 573-595, 2010
1642010
Frequency-domain system identification using non-parametric noise models estimated from a small number of data sets
J Schoukens, R Pintelon, G Vandersteen, P Guillaume
Automatica 33 (6), 1073-1086, 1997
1621997
A 57-to-66GHz quadrature PLL in 45nm digital CMOS
K Scheir, G Vandersteen, Y Rolain, P Wambacq
2009 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2009
1222009
Nonlinear least-squares modeling of 3D interaction position in a monolithic scintillator block
Z Li, M Wedrowski, P Bruyndonckx, G Vandersteen
Physics in Medicine & Biology 55 (21), 6515, 2010
902010
Robustness issues of the best linear approximation of a nonlinear system
J Schoukens, J Lataire, R Pintelon, G Vandersteen, T Dobrowiecki
IEEE Transactions on Instrumentation and Measurement 58 (5), 1737-1745, 2009
812009
Estimation of nonparametric noise and FRF models for multivariable systems—Part II: Extensions, applications
R Pintelon, J Schoukens, G Vandersteen, K Barbé
Mechanical Systems and Signal Processing 24 (3), 596-616, 2010
802010
Nonparametric preprocessing in system identification: a powerful tool
J Schoukens, G Vandersteen, K Barbé, R Pintelon
2009 European Control Conference (ECC), 1-14, 2009
772009
Experimental characterization of operational amplifiers: a system identification approach-Part I: theory and simulations
R Pintelon, G Vandersteen, L De Locht, Y Rolain, J Schoukens
IEEE Transactions on Instrumentation and Measurement 53 (3), 854-862, 2004
762004
Basics of broadband impedance spectroscopy measurements using periodic excitations
B Sanchez, G Vandersteen, R Bragos, J Schoukens
Measurement Science and Technology 23 (10), 105501, 2012
682012
Optimal multisine excitation design for broadband electrical impedance spectroscopy
B Sanchez, G Vandersteen, R Bragos, J Schoukens
Measurement Science and Technology 22 (11), 115601, 2011
632011
Improved (non-) parametric identification of dynamic systems excited by periodic signals—The multivariate case
R Pintelon, G Vandersteen, J Schoukens, Y Rolain
Mechanical Systems and Signal Processing 25 (8), 2892-2922, 2011
602011
Multirate cascaded discrete-time low-pass ΔΣ modulator for GSM/Bluetooth/UMTS
L Bos, G Vandersteen, P Rombouts, A Geis, A Morgado, Y Rolain, ...
IEEE Journal of Solid-State Circuits 45 (6), 1198-1208, 2010
572010
Device and method for calibrating MIMO systems
J Liu, G Vandersteen
US Patent 8,126,040, 2012
552012
Novel estimation of the electrical bioimpedance using the local polynomial method. Application to in vivo real-time myocardium tissue impedance characterization during the …
B Sanchez, J Schoukens, R Bragos, G Vandersteen
IEEE Transactions on Biomedical Engineering 58 (12), 3376-3385, 2011
532011
Measurement and identification of nonlinear systems consisting of linear dynamic blocks and one static nonlinearity
G Vandersteen, J Schoukens
IEEE Transactions on Automatic Control 44 (6), 1266-1271, 1999
531999
Analyses, development, and applications of TLS algorithms in frequency domain system identification
R Pintelon, P Guillaume, G Vandersteen, Y Rolain
SIAM journal on matrix analysis and applications 19 (4), 983-1004, 1998
531998
Non-parametric estimation of the frequency-response functions of the linear blocks of a Wiener-Hammerstein model
G Vandersteen, Y Rolain, J Schoukens
Automatica 33 (7), 1351-1355, 1997
521997
Identification of linear and nonlinear systems in an errors-in-variables least squares and total least squares framework
G Vandersteen
Phdthesis, Vrije Universiteit Brussel, 1997
511997
Signal reconstruction for nonequidistant finite length sample sets: a" KIS" approach
Y Rolain, J Schoukens, G Vandersteen
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement …, 1998
461998
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Articles 1–20