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Bart Swinnen
Bart Swinnen
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Verified email at imec.be
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Cited by
Cited by
Year
The phenotypic variability of amyotrophic lateral sclerosis
B Swinnen, W Robberecht
Nature Reviews Neurology 10 (11), 661-670, 2014
6612014
3-D technology assessment: Path-finding the technology/design sweet-spot
P Marchal, B Bougard, G Katti, M Stucchi, W Dehaene, A Papanikolaou, ...
Proceedings of the IEEE 97 (1), 96-107, 2009
2792009
3D integration by Cu-Cu thermo-compression bonding of extremely thinned bulk-Si die containing 10 μm pitch through-Si vias
B Swinnen, W Ruythooren, P De Moor, L Bogaerts, L Carbonell, ...
2006 International Electron Devices Meeting, 1-4, 2006
2562006
3D stacked IC demonstration using a through silicon via first approach
J Van Olmen, A Mercha, G Katti, C Huyghebaert, J Van Aelst, E Seppala, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
1822008
Comprehensive analysis of the impact of single and arrays of through silicon vias induced stress on high-k/metal gate CMOS performance
A Mercha, G Van der Plas, V Moroz, I De Wolf, P Asimakopoulos, N Minas, ...
2010 International Electron Devices Meeting, 2.2. 1-2.2. 4, 2010
1402010
Intravenous alteplase for stroke with unknown time of onset guided by advanced imaging: systematic review and meta-analysis of individual patient data
G Thomalla, F Boutitie, H Ma, M Koga, P Ringleb, LH Schwamm, O Wu, ...
The Lancet 396 (10262), 1574-1584, 2020
1372020
A zebrafish model for C9orf72 ALS reveals RNA toxicity as a pathogenic mechanism
B Swinnen, A Bento-Abreu, TF Gendron, S Boeynaems, E Bogaert, ...
Acta neuropathologica 135, 427-443, 2018
1362018
RNA toxicity in non‐coding repeat expansion disorders
B Swinnen, W Robberecht, L Van Den Bosch
The EMBO journal 39 (1), e101112, 2020
1322020
Through-silicon via and die stacking technologies for microsystems-integration
E Beyne, P De Moor, W Ruythooren, R Labie, A Jourdain, H Tilmans, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
1272008
Impact of 3D design choices on manufacturing cost
D Velenis, M Stucchi, EJ Marinissen, B Swinnen, E Beyne
2009 IEEE International Conference on 3D System Integration, 1-5, 2009
1242009
Mechanical reliability of Au and Cu wire bonds to Al, Ni/Au and Ni/Pd/Au capped Cu bond pads
P Ratchev, S Stoukatch, B Swinnen
Microelectronics Reliability 46 (8), 1315-1325, 2006
1062006
3D stacked ICs using Cu TSVs and die to wafer hybrid collective bonding
G Katti, A Mercha, J Van Olmen, C Huyghebaert, A Jourdain, M Stucchi, ...
2009 IEEE international electron devices meeting (IEDM), 1-4, 2009
862009
Method for chip singulation
E Beyne, B Swinnen, S Vanhaelemeersch
US Patent 7,566,634, 2009
842009
Extraction of the appropriate material property for realistic modeling of through-silicon-vias using μ-Raman spectroscopy
C Okoro, Y Yang, B Vandevelde, B Swinnen, D Vandepitte, B Verlinden, ...
2008 International Interconnect Technology Conference, 16-18, 2008
842008
Via first plus via last technique for IC interconnects
K Kaskoun, S Gu, B Swinnen
US Patent 7,939,926, 2011
822011
Scalable through silicon via with polymer deep trench isolation for 3D wafer level packaging
DS Tezcan, F Duval, H Philipsen, O Luhn, P Soussan, B Swinnen
2009 59th Electronic Components and Technology Conference, 1159-1164, 2009
712009
Elongator subunit 3 (ELP3) modifies ALS through tRNA modification
A Bento-Abreu, G Jager, B Swinnen, L Rué, S Hendrickx, A Jones, ...
Human molecular genetics 27 (7), 1276-1289, 2018
672018
Styloid and hyoid bone proximity is a risk factor for cervical carotid artery dissection
D Renard, S Azakri, C Arquizan, B Swinnen, P Labauge, V Thijs
Stroke 44 (9), 2475-2479, 2013
652013
Simultaneous Cu-Cu and compliant dielectric bonding for 3D stacking of ICs
A Jourdain, S Stoukatch, P De Moor, W Ruythooren, S Pargfrieder, ...
2007 IEEE International Interconnect Technology Conferencee, 207-209, 2007
622007
HDAC6 inhibition restores TDP‐43 pathology and axonal transport defects in human motor neurons with TARDBP mutations
R Fazal, S Boeynaems, A Swijsen, M De Decker, L Fumagalli, M Moisse, ...
The EMBO journal 40 (7), e106177, 2021
612021
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