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Jaakko Julin
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Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion
OME Ylivaara, X Liu, L Kilpi, J Lyytinen, D Schneider, M Laitinen, J Julin, ...
Thin Solid Films 552, 124-135, 2014
2012014
Potku–new analysis software for heavy ion elastic recoil detection analysis
K Arstila, J Julin, MI Laitinen, J Aalto, T Konu, S Kärkkäinen, S Rahkonen, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
2002014
Bandgap lowering in mixed alloys of Cs 2 Ag (Sb x Bi 1− x) Br 6 double perovskite thin films
Z Li, SR Kavanagh, M Napari, RG Palgrave, M Abdi-Jalebi, ...
Journal of Materials Chemistry A 8 (41), 21780-21788, 2020
862020
Time-of-flight–Energy spectrometer for elemental depth profiling–Jyväskylä design
M Laitinen, M Rossi, J Julin, T Sajavaara
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
832014
Aluminum oxide/titanium dioxide nanolaminates grown by atomic layer deposition: Growth and mechanical properties
OME Ylivaara, L Kilpi, X Liu, S Sintonen, S Ali, M Laitinen, J Julin, E Haimi, ...
Journal of Vacuum Science & Technology A 35 (1), 2017
492017
Strong absorption and ultrafast localisation in NaBiS2 nanocrystals with slow charge-carrier recombination
YT Huang, SR Kavanagh, M Righetto, M Rusu, I Levine, T Unold, ...
Nature communications 13 (1), 4960, 2022
402022
Microstructural evolution and thermal stability of AlCr(Si)N hard coatings revealed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction
N Jäger, M Meindlhumer, S Spor, H Hruby, J Julin, A Stark, F Nahif, ...
Acta Materialia, 2020
392020
Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition
M Napari, J Malm, R Lehto, J Julin, K Arstila, T Sajavaara, M Lahtinen
Journal of Vacuum Science & Technology A 33 (1), 2015
382015
Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction
N Jäger, S Klima, H Hruby, J Julin, M Burghammer, JF Keckes, C Mitterer, ...
Acta Materialia 162, 55-66, 2019
342019
Structural Properties of Al–O Monolayers in SiO2 on Silicon and the Maximization of Their Negative Fixed Charge Density
D Hiller, J Göttlicher, R Steininger, T Huthwelker, J Julin, F Munnik, ...
ACS applied materials & interfaces 10 (36), 30495-30505, 2018
322018
Transition-edge sensors for particle induced X-ray emission measurements
MRJ Palosaari, KM Kinnunen, J Julin, M Laitinen, M Napari, T Sajavaara, ...
Journal of Low Temperature Physics 176, 285-290, 2014
292014
Room-temperature plasma-enhanced atomic layer deposition of ZnO: Film growth dependence on the PEALD reactor configuration
M Napari, M Lahtinen, A Veselov, J Julin, E Østreng, T Sajavaara
Surface and Coatings Technology 326, 281-290, 2017
252017
Broadband ultrahigh-resolution spectroscopy of particle-induced X rays: extending the limits of nondestructive analysis
MRJ Palosaari, M Käyhkö, KM Kinnunen, M Laitinen, J Julin, J Malm, ...
Physical Review Applied 6 (2), 024002, 2016
222016
Thermo-physical properties of coatings in the Ti (B, N) system grown by chemical vapor deposition
C Kainz, N Schalk, M Tkadletz, C Saringer, M Winkler, A Stark, N Schell, ...
Surface and Coatings Technology 384, 125318, 2020
212020
Mechanical and optical properties of as-grown and thermally annealed titanium dioxide from titanium tetrachloride and water by atomic layer deposition
OME Ylivaara, A Langner, X Liu, D Schneider, J Julin, K Arstila, ...
Thin Solid Films 732, 138758, 2021
202021
Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate
J Lyytinen, X Liu, OME Ylivaara, S Sintonen, A Iyer, S Ali, J Julin, ...
Wear 342, 270-278, 2015
182015
Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectrometer
M Laitinen, T Sajavaara, M Rossi, J Julin, RL Puurunen, T Suni, T Ishida, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2011
182011
Kinetics of Bulk Lifetime Degradation in Float‐Zone Silicon: Fast Activation and Annihilation of Grown‐In Defects and the Role of Hydrogen versus Light
D Hiller, VP Markevich, JAT de Guzman, D König, S Prucnal, W Bock, ...
physica status solidi (a) 217 (17), 2000436, 2020
152020
Low‐Temperature Atomic Layer Deposition of High‐k SbOx for Thin Film Transistors
J Yang, A Bahrami, X Ding, P Zhao, S He, S Lehmann, M Laitinen, J Julin, ...
Advanced Electronic Materials 8 (7), 2101334, 2022
142022
Energy-loss straggling of 2–10 MeV/u Kr ions in gases
C Vockenhuber, J Jensen, J Julin, H Kettunen, M Laitinen, M Rossi, ...
The European Physical Journal D 67, 1-9, 2013
142013
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