Dirk Van Dyck
Dirk Van Dyck
Onbekend partnerschap
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TitelGeciteerd doorJaar
Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays
P Cloetens, W Ludwig, J Baruchel, D Van Dyck, J Van Landuyt, JP Guigay, ...
Applied physics letters 75 (19), 2912-2914, 1999
8451999
Statistical texture characterization from discrete wavelet representations
G Van de Wouwer, P Scheunders, D Van Dyck
IEEE transactions on image processing 8 (4), 592-598, 1999
7011999
Maximum-likelihood estimation of Rician distribution parameters
J Sijbers, AJ den Dekker, P Scheunders, D Van Dyck
IEEE Transactions on Medical Imaging 17 (3), 357-361, 1998
4261998
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
W Coene, G Janssen, MO de Beeck, D Van Dyck
Physical Review Letters 69 (26), 3743, 1992
4071992
Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
WMJ Coene, A Thust, MO De Beeck, D Van Dyck
Ultramicroscopy 64 (1-4), 109-135, 1996
4041996
Estimation of the noise in magnitude MR images
J Sijbers, AJ Den Dekker, J Van Audekerke, M Verhoye, D Van Dyck
Magnetic Resonance Imaging 16 (1), 87-90, 1998
3081998
Focal-series reconstruction in HRTEM: Simulation studies on non-periodic objects
A Thust, WMJ Coene, MO De Beeck, D Van Dyck
Ultramicroscopy 64 (1-4), 211-230, 1996
2901996
Watershed-based segmentation of 3D MR data for volume quantization
J Sijbers, P Scheunders, M Verhoye, A Van der Linden, D Van Dyck, ...
Magnetic Resonance Imaging 15 (6), 679-688, 1997
2251997
Wavelet correlation signatures for color texture characterization
G Van de Wouwer, P Scheunders, S Livens, D Van Dyck
Pattern recognition 32 (3), 443-451, 1999
1901999
Desktop X‐ray microscopy and microtomography
V Dyck
Journal of Microscopy 191 (2), 151-158, 1998
1871998
A simple intuitive theory for electron diffraction
D Van Dyck, MO De Beeck
Ultramicroscopy 64 (1-4), 99-107, 1996
1851996
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ...
Ultramicroscopy 109 (10), 1236-1244, 2009
1712009
Wavelets for texture analysis, an overview
S Livens, P Scheunders, G Van de Wouwer, D Van Dyck
IET Digital Library, 1997
1541997
Wave function reconstruction in HRTEM: the parabola method
MO De Beeck, D Van Dyck, W Coene
Ultramicroscopy 64 (1-4), 167-183, 1996
1531996
Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry, Methods II
S Amelinckx, D Van Dyck, J van Landuyt, G Van Tendeloo
John Wiley & Sons, 2008
151*2008
Electron microscopy: principles and fundamentals
S Amelinckx, D Van Dyck, J Van Landuyt, G Van Tendeloo
John Wiley & Sons, 2008
1232008
Quantification of segregation and mass transport in In x Ga 1− x A s/G a A s Stranski-Krastanow layers
A Rosenauer, D Gerthsen, D Van Dyck, M Arzberger, G Böhm, ...
Physical Review B 64 (24), 245334, 2001
1222001
Parameter estimation from magnitude MR images
J Sijbers, AJ den Dekker, E Raman, D Van Dyck
International Journal of imaging systems and technology 10 (2), 109-114, 1999
1221999
The real space method for dynamical electron diffraction calculations in high resolution electron microscopy: I. Principles of the method
D Van Dyck, W Coene
Ultramicroscopy 15 (1-2), 29-40, 1984
1181984
A cluster model for the transition state and its study by means of electron diffraction I. Theoretical model
R De Ridder, G Van Tendeloo, D Van Dyck, S Amelinckx
physica status solidi (a) 38 (2), 663-674, 1976
1111976
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Artikelen 1–20