Katsuichi Kitagawa
Katsuichi Kitagawa
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Cited by
Cited by
Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory
A Hirabayashi, H Ogawa, K Kitagawa
Applied Optics 41 (23), 4876-4883, 2002
Thin-film thickness profile measurement by three-wavelength interference color analysis
K Kitagawa
Applied optics 52 (10), 1998-2007, 2013
Single-shot surface profiling by local model fitting
M Sugiyama, H Ogawa, K Kitagawa, K Suzuki
Applied Optics 45 (31), 7999-8005, 2006
Fast surface profiling by multi-wavelength single-shot interferometry
K Kitagawa
International Journal of Optomechatronics 4 (2), 136-156, 2010
Single-shot surface profiling by multiwavelength interferometry without carrier fringe introduction
K Kitagawa
Journal of Electronic Imaging 21 (2), 021107-021107, 2012
Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry
K Kitagawa
Optics Letters 39 (14), 4172-4175, 2014
Development of new hybrid transmission for 2009 Prius
A Takasaki, T Mizutani, K Kitagawa, T Yamahana, K Odaka, T Kuzuya, ...
Proc. EVS24 Int. Battery, Hybrid Fuel Cell Elect. Veh. Symp., 2009
Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm
A Hirabayashi, H Ogawa, K Kitagawa
Optical Manufacturing and Testing IV 4451, 356-367, 2001
Multiwavelength single-shot interferometry without carrier fringe introduction
K Kitagawa
Tenth International Conference on Quality Control by Artificial Vision 8000 …, 2011
Thin film thickness profile measurement using an interferometric surface profiler
K Kitagawa
Optomechatronic Sensors and Instrumentation III 6716, 52-63, 2007
Two-wavelength single-shot interferometry
K Kitagawa, M Sugiyama, T Matsuzaka, H Ogawa, K Suzuki
SICE Annual Conference 2007, 724-728, 2007
3D profiling of a transparent film using white-light interferometry
K Kitagawa
SICE 2004 Annual Conference 1, 585-590, 2004
Burning rate anomaly of composite propellant grains
H Hasegawa, M Fukunaga, K Kitagawa, T Shimada
Combustion, Explosion, and Shock Waves 49, 583-592, 2013
Surface profile measuring method and apparatus
H Ogawa, A Hirabayashi, K Kitagawa
US Patent 6,501,553, 2002
Method for measuring surface profile, and apparatus using the same
M Sugiyama, H Ogawa, K Kitagawa, K Suzuki
US Patent 7,852,489, 2010
Multi-wavelength single-shot interferometry
K Kitagawa
2009 International Symposium on Optomechatronic Technologies, 34-39, 2009
Simultaneous measurement of film surface topography and thickness variation using white-light interferometry
K Kitagawa
Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems 6375 …, 2006
Fast surface profiling by white-light interferometry using a sampling theorem for band-pass signals
A Hirabayashi, H Ogawa, T Mizutani, K Nagai, K Kitagawa
Transactions of the Society of Instrument and Control Engineers 36 (1), 16-25, 2000
Recent trends in white-light interferometry
K Kitagawa
Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 638201, 2006
Five-year point prevalence survey of healthcare-associated infections and antimicrobial use in a Japanese university hospital
H Morioka, M Iguchi, N Tetsuka, F Kinoshita, Y Tomita, D Kato, ...
Infection Prevention in Practice 3 (3), 100151, 2021
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