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Co-authors
Aldo Di CarloProf. of Opto&Nano-electronics, University of Rome Tor Vergata. Consiglio Nazionale delle RicercheVerified email at uniroma2.it- Alessandro PecchiaCNR-ISMNVerified email at ismn.cnr.it
- Matthias Auf der MaurUniversity of Rome "Tor Vergata"Verified email at ing.uniroma2.it
- Gabriele PenazziR&D EngineerVerified email at synopsys.com
- Jeffrey GrossmanProfessor of Materials Science and Engineering, MITVerified email at mit.edu
- Alessio GagliardiTechnische Universitaet MuenchenVerified email at tum.de
- Michael PovolotskyiJacobs TechnologiesVerified email at jacobs.com
- A Gilad KusneMaterials Measurement & Science Division, NIST & Materials Science & Engineering, UMDVerified email at umd.edu
- Thomas FrauenheimProfessor für Computational Materials ScienceVerified email at bccms.uni-bremen.de
- Tonio BuonassisiMassachusetts Institute of TechnologyVerified email at mit.edu
- ZEKUN RENSingapore MIT Alliance for Research and TechnologyVerified email at smart.mit.edu
- Felipe OviedoMITVerified email at mit.edu
- Savitha RamasamyInstitute of Infocomm Research; Senior Member, IEEEVerified email at i2r.a-star.edu.sg
- Noor Titan Putri HartonoData Scientist, SolarLab Aiko EuropeVerified email at solarlab-aiko.com
- Siyu Isaac Parker TianPhD, National University of SingaporeVerified email at u.nus.edu
- Brian L. DeCostNational Institute of Standards and TechnologyVerified email at nist.gov
- Zhe LiuMassachusetts Institute of TechnologyVerified email at mit.edu
- Steven JohnsonProfessor of Applied Mathematics and Physics, Massachusetts Institute of TechnologyVerified email at math.mit.edu
- David BroidoDepartment of Physics, Boston CollegeVerified email at bc.edu
- Thomas NiehausInstitut Lumière Matière, Université Claude Bernard Lyon 1Verified email at univ-lyon1.fr
